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Abstract |
In this talk, our recent progress on inverse surface scattering problems will be discussed. I will present new approaches to achieve subwavelength resolution for the inverse problems. The methods require only a single incident field and are realized by using the fast Fourier transform. The error estimates of the solution for the model equation will be addressed. I will also highlight ongoing projects in rough surface imaging, random medium imaging, and near-field and nano- optics modeling. |
